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Charge trap levels in sulfur-doped chemical-vapor-deposited diamond with applications to ultraviolet dosimetry
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10.1063/1.1984079
/content/aip/journal/jap/98/2/10.1063/1.1984079
http://aip.metastore.ingenta.com/content/aip/journal/jap/98/2/10.1063/1.1984079
/content/aip/journal/jap/98/2/10.1063/1.1984079
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/content/aip/journal/jap/98/2/10.1063/1.1984079
2005-07-19
2014-09-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Charge trap levels in sulfur-doped chemical-vapor-deposited diamond with applications to ultraviolet dosimetry
http://aip.metastore.ingenta.com/content/aip/journal/jap/98/2/10.1063/1.1984079
10.1063/1.1984079
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