A high-resolution cross-sectional TEM image of a VC-QD.
Normalized PL spectra at from three QD samples.
Wavelength-integrated PL intensities as a function of the excitation intensity. The solid lines represent linear fits.
Normalized time-resolved PL profiles throughout the PL band for the three QD samples.
Normalized time-resolved PL profiles from VC-QD, with respect to the excitation intensity at a slightly higher energy than the GS peak .
Carrier rise characteristics at different energy positions within the GS PL band for VC-QD.
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