(a) CL spectrum of after deconvolution into four bands and (b) the band scheme for the observed transitions.
Draft of the CL and COD measurements needed for the characterization of the PS coefficient by the indentation-crack-tip calibration method.
Raman spectra collected on different crystallographic planes of single crystal: plane (a) and plane (b). The spectral line indicated with the letter “P” is a plasma line, which was used as an internal wave-number reference for calibrating the spectrometer.
CL spectra averaged among 20 locations for each (a) and planes (b) and their deconvolution into four bands. Note the additional band in (b) (plotted by a broken line), which corresponds to the energy gap of .
Simulation plot of stress-free spectral position as a function of intensity ratio . The experimentally observed average and maximum data scatters are shown by the broken and full lines, respectively.
(Color) (a) Schematic of indentation-crack morphology on different crystallographic planes of . (b) SEM micrograph of an indentation print on the plane. (c) SEM micrograph of an indentation print on the plane.
(Color) Polarized optical micrographs of (a) plane and (b) plane and the XRD patterns detected on their respective surfaces in (c) and (d), respectively.
(Color) Results of XRD characterization on the cross section of the single crystal corresponding to the plane perpendicular to the plane on which 90° domains were observed: (a) schematic of the domain configuration; (b) HR-XRD intensity of (400) and (004) reflections along the cross section.
COD profile of an indentation crack propagated within the (113) plane. The full line represents a least-square fitting line according to Eqs. (19) and (20). The characteristic lengths of the microcrack were and . The slope of the plot represents the stored at the tip of the microcrack.
Wavelength variation at maximum of the CL spectrum of single crystal as a function of the distance ahead of a microcrack propagated within the (113) crystallographic (cleavage) plane.
Procedure followed to determine the wavelength at maximum of the CL spectrum of .
Results of uniaxial PS calibration on the and planes of single crystal [in (a) and (b), respectively]. Each data point is obtained from the average of 20 data collected under the same loading conditions.
Variations with applied stress of FWHM and wavelength at maximum of the band components belonging to the CL spectrum of single crystal: (a) band I; (b) band II; (c) FWHM of the overall CL spectrum; and (d) spectral distance between bands II and I.
(Color) SEM micrograph (a) and residual stress map (b) collected in the neighborhood of the corner of an indentation print on the plane of the crystal.
Morphological characteristics of various spectral bands of the CL spectrum of single crystal.
Article metrics loading...
Full text loading...