1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Nanometric deformations of thin Nb layers under a strong electric field using soft x-ray laser interferometry
Rent:
Rent this article for
USD
10.1063/1.2010620
/content/aip/journal/jap/98/4/10.1063/1.2010620
http://aip.metastore.ingenta.com/content/aip/journal/jap/98/4/10.1063/1.2010620
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Experimental arrangement of the soft x-ray laser and the interferometric arm (not to scale). The XRL beam is switched between the footprint monitor and the interferometer by a retractable multilayer mirror working at 45°. Another multilayer mirror at 45° sends the beam to the interferometer, polarizing it vertically.

Image of FIG. 2.
FIG. 2.

Schematic of the niobium-coated flat substrate and an iron knife electrode system, showing the principle of the probing technique (not to scale).

Image of FIG. 3.
FIG. 3.

Setup of the HV electric circuit. Both positive and negative voltages up to may be applied to the system Nb electrode-knife edge.

Image of FIG. 4.
FIG. 4.

Fresnel bimirror interferometer, analyzing the x-ray beam reflected from the vertically orientated Nb cathode (not to scale); the probing XRL beam is vertically polarized. The cathode is located at a distance of from the XRL exit aperture and a few centimeters before the Fresnel bimirror; the optical distance between the bimirror and the CCD camera is . The grazing incidence of the CCD is 6° in order to enhance the apparent fringe shift.

Image of FIG. 5.
FIG. 5.

Field-emission current measured at the negative polarity of the niobium cathode (Nb acts as an emitter of electrons), as a function of the applied dc voltage.

Image of FIG. 6.
FIG. 6.

(Color) A sequence of interferograms of the Nb surface at negative potential, subjected to dc field between 0 (reference) and . The scale bar corresponds to the distance on the probed surface; fringe shift by one period corresponds to surface elevation of . The red quadrangles correspond to regions converted to the surface maps in Fig. 7.

Image of FIG. 7.
FIG. 7.

(Color) Surface maps of the Nb layer at the individual values of the electric field, reconstructed from the corresponding interferograms shown in Fig. 6.

Image of FIG. 8.
FIG. 8.

Field-emission current with the Nb layer at positive potential (Nb acts as collector of electrons emitted from the knife electrode), accompanying the increasing bias voltage: value of the current, ▵, and maximal values detected.

Image of FIG. 9.
FIG. 9.

(Color) A sequence of recorded interferograms for the niobium layer at positive potential, with electric field gradually increasing from 0 (reference) to . The scale corresponds to the distance across the Nb surface; fringe shift by one period corresponds to surface elevation of about . The red quadrangles correspond to regions converted to the surface maps in Fig. 10.

Image of FIG. 10.
FIG. 10.

(Color) Surface maps of the Nb layer at the individual values of the electric field, reconstructed from the corresponding interferograms from Fig. 9.

Loading

Article metrics loading...

/content/aip/journal/jap/98/4/10.1063/1.2010620
2005-08-18
2014-04-24
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Nanometric deformations of thin Nb layers under a strong electric field using soft x-ray laser interferometry
http://aip.metastore.ingenta.com/content/aip/journal/jap/98/4/10.1063/1.2010620
10.1063/1.2010620
SEARCH_EXPAND_ITEM