SEM image of the single-crystal whisker using Te-doped precursor.
XRD pattern in the wide surface ( plane) of an as-grown single-crystal whisker.
characteristics of an as-grown and annealed single-crystal whisker along the plane and axis. For the c axis direction measurement sample, cross-sectional area and length of junctions are about and , respectively. Annealing conditions of Y-123 junctions are , in vacuum atmosphere.
characteristics of the intrinsic Josephson junction in annealed Y-123 junctions at and self-field. Annealing conditions of Y-123 junctions are , in vacuum atmosphere. Cross-sectional area and length of junctions are about and , respectively. and are about and , respectively.
Lengths of whiskers grown by various growth conditions, such as the nominal compositions of precursors, partial melting temperature , holding time at partial melting temperature , slow cooling rate down to (CR), and atmosphere .
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