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Capacitive effects in quasi-steady-state voltage and lifetime measurements of silicon devices
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10.1063/1.2073973
/content/aip/journal/jap/98/7/10.1063/1.2073973
http://aip.metastore.ingenta.com/content/aip/journal/jap/98/7/10.1063/1.2073973
/content/aip/journal/jap/98/7/10.1063/1.2073973
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/content/aip/journal/jap/98/7/10.1063/1.2073973
2005-10-11
2014-09-02
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Capacitive effects in quasi-steady-state voltage and lifetime measurements of silicon devices
http://aip.metastore.ingenta.com/content/aip/journal/jap/98/7/10.1063/1.2073973
10.1063/1.2073973
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