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XRD pattern change for PMN-PT films with different PT contents grown on substrates. (*: Second phase, MgO 200.)
High-resolution x-ray diffraction reciprocal space mapping (HRXRD-RSM) around 204 for PMN-PT film with . (Tet.: tetragonal, R/PC: rhombohedral or pseudocubic.)
Dependencies of (a) room temperature relative dielectric constant, , measured at 1 kHz, (b) longitudinal piezoelectric coefficient, , and (c) coefficient on for (100)-/(001)-oriented epitaxial PMN-PT films. Constituent phases are also shown in this figure.
Polarization and field-induced strain vs bipolar driven electric field simultaneously measured at 5 Hz for (100)-/(001)-oriented epitaxial PMN-PT films with different values. [; 0.00 (broken line), 0.46 (thick solid line), 0.75 (thin solid line).]
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