A simplified diagram for the low-frequency noise measurements.
Thermal noise as a function of channel length for the three samples A, B, and C. The arrows indicate thermal noise in the access resistances.
The density noise spectrum for two applied voltages (50 and ). The inset contains the spectrum decomposition to deduce different contributions to the total noise.
Arrhenius plot of vs . The extraction of thermal activation energies is made from Eq. (4).
The vs at . The ln-ln procedure was repeated for many temperatures to deduce the slope which is given in Table III.
Resistivity, mobility, and density of the 2DEG for studied samples. Measurements were made at 300 and in the dark.
Thermal activation energies and time constants for studied samples.
Values rate deduced from of vs . The slope is close to 2 indicating that the mobility fluctuation is due to the lattice dispersion.
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