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Fault tolerance calculations for clocked quantum-dot cellular automata devices
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10.1063/1.2128473
/content/aip/journal/jap/98/9/10.1063/1.2128473
http://aip.metastore.ingenta.com/content/aip/journal/jap/98/9/10.1063/1.2128473
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

A schematic representation of a QCA wire.

Image of FIG. 2.
FIG. 2.

(a) A QCA wire separated in clocking zones labeled from 1 to 4, acting as a shift register. (b) The time-dependence profile of potential barrier for the interdot tunneling (arbitrary units). (c) The shift of the potential barrier profile for adjacent clocking zones.

Image of FIG. 3.
FIG. 3.

Success rate for one- and multiline QCA shift registers vs temperature and displacement factor . Cases for one to four lines are shown in (a), (b), (c) and (d), respectively. A clocking pattern with one cell per clocking zone in longitudinal direction and a normal distribution of positional defects of dots within cells is used.

Image of FIG. 4.
FIG. 4.

Success rate for a QCA shift register vs displacement factor. Success rate is plotted for one- and multiline shift registers: (a) four lines, (b) three lines, (c) two lines, and (d) 1 line. Temperature and the normal distribution are used.

Image of FIG. 5.
FIG. 5.

Contour plots in the plane for the acceptable operationality zones, for one- and multiline QCA shift registers: (a) four lines, (b) three lines, (c) two lines, and (d) one line. (The clocking pattern and the distribution are the same as in Fig. 3.)

Image of FIG. 6.
FIG. 6.

Contour plots in the plane for the acceptable operationality zones, for one-line QCA shift registers. The clocking pattern has (a) one cell, (b) two cells, (c) three cells, and (d) four cells per clocking zone in longitudinal direction. The normal distribution is used.

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/content/aip/journal/jap/98/9/10.1063/1.2128473
2005-11-09
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Fault tolerance calculations for clocked quantum-dot cellular automata devices
http://aip.metastore.ingenta.com/content/aip/journal/jap/98/9/10.1063/1.2128473
10.1063/1.2128473
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