1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
A transmission electron microscopy study of defects formed through the capping layer of self-assembled quantum dot samples
Rent:
Rent this article for
USD
10.1063/1.2197038
/content/aip/journal/jap/99/11/10.1063/1.2197038
http://aip.metastore.ingenta.com/content/aip/journal/jap/99/11/10.1063/1.2197038
/content/aip/journal/jap/99/11/10.1063/1.2197038
Loading

Data & Media loading...

Loading

Article metrics loading...

/content/aip/journal/jap/99/11/10.1063/1.2197038
2006-06-01
2014-08-01
Loading

Full text loading...

This is a required field
Please enter a valid email address
This feature is disabled while Scitation upgrades its access control system.
This feature is disabled while Scitation upgrades its access control system.
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: A transmission electron microscopy study of defects formed through the capping layer of self-assembled InAs∕GaAs quantum dot samples
http://aip.metastore.ingenta.com/content/aip/journal/jap/99/11/10.1063/1.2197038
10.1063/1.2197038
SEARCH_EXPAND_ITEM