STM image of a -thick Fe(110) film deposited on the system at RT and subsequently annealed at . The inset shows a LEED pattern of the same film. The white arrow marks a screw dislocation.
High-resolution cross-sectional TEM micrograph of the layer system on an substrate. The positions of the interfaces are marked by white lines. The image was taken along the in-plane  zone axis, which was verified by evaluating electron-diffraction patterns.
SQUID hysteresis loop measurements of Fe(110) on with the magnetic field applied along (a) the in-plane  direction and (b) the in-plane direction.
Frequencies of the Damon-Eshbach mode as a function of the in-plane rotation angle for different thicknesses of the Fe film. is measured between the external field and the Fe  axis. The solid lines are obtained by fitting the data as described in Sec. IV. The curves are offset for clarity.
Anisotropy constants and for Fe(110) films of different thicknesses on a Mo(110)-buffer layer. The errors in are calculated from estimated deviations of 10% in thickness and in magnetic field. For they are smaller than the symbol size.
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