AFM images corresponding to the samples grown at (a) RT and (b) 300, (c) 400, (d) 500, (e) 600, (f) and . (g) Profiles of the samples grown at RT and 300, 400, 500, and . A two-dimensional to three-dimensional growth mode transition is observed.
Symmetric x-ray diffraction scans for the structures with different FePd deposition temperatures. The position of Pd(200), FePd(200), FePd(002), V(200), and FeV(200) bulk peaks is indicated.
(a) Rocking curves measured in the FePd(200) peaks, (b) sketch of the atomic plane evolution and (c) mosaic of the FePd films as a function of the deposition temperature.
Determined in-plane (a) and out-of-plane (c) lattice parameters of V, FeV, and FePd as a function of the deposition temperature. The bulk values are indicated in each case by a dashed line.
(a), (c), and (e) TEM micrograph of the samples grown at 100, 400, and , respectively. (b), (d), and (f) EELS spectra for the mentioned samples measured in the points marked in the images shown beside. The peaks , , , and are studied. Note the absence of V in the FePd layer in the sample, how V appears in different points of the FePd layer in the sample, and the constant concentration of V along the FePd layer in the sample.
Evolution of Pd, Fe, V, Mg, and O concentrations vs the distance from the surface, as detected by XPS for the samples grown at RT (a) and (b).
(a) Saturation magnetization of the samples as a function of the deposition temperature measured with SQUID; the line is just a guide for the eyes. (b) Evolution of the polar (left) and transverse (right) Kerr loops with temperature. For the transverse loops, two curves are shown, one obtained for the  direction and the other for the  direction. Please note the different scales in the transverse loops.
MFM images of different samples. Sizes of for the RT sample and for the 400 and samples.
Polar Kerr rotation spectra of the samples grown at different temperatures.
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