Typical resistance-magnetic-field curves (a) without and (b) with the edge oxidization. Switching fields , , and are defined by the switching fields at the point of the resistance changes of 50%, 10%, and 90%, respectively.
Dependence of and as a function of oxygen radical exposure times for the surface-oxidized blanket NiFe films.
Normalized as a function of edge for a single NiFe free layer model with remanent domain configurations of an state and a state.
Remanent magnetization configurations for single NiFe free layer models, in the case of a remanent state with the edge of (a) and (b) and in the case of a remanent state with the edge of (c) and (d) .
Normalized magnetic switching curves of pseudo-MTJ stack models with and without the edge reduction, in the case of the remanent domain configurations of (a) an state and (b) a state.
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