1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Engineering of spin filtering in double epitaxial tunnel junctions
Rent:
Rent this article for
USD
10.1063/1.2166592
/content/aip/journal/jap/99/8/10.1063/1.2166592
http://aip.metastore.ingenta.com/content/aip/journal/jap/99/8/10.1063/1.2166592
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Top panel: RHEED patterns measured along the [10] and [11] azimuths of the square lattice of the bottom Fe-I. Middle panel: RHEED pattern measured along the [10] and [11] azimuths of the square lattice of the middle Fe-II. Bottom panel: RHEED oscillations observed on the (00) streak during the thin MgO barrier (of the AAF) grown at room temperature. The maxima denoted states 1–3 correspond to the completion of an atomic MgO layer.

Image of FIG. 2.
FIG. 2.

Top panel: magnetization curve measured on a continuous film stack. Bottom panel: resistance vs field curve, measured at 10 mV positive bias, branch from the positive to negative field (-●-) and branch from negative to positive field (-◯-). Right panel: sketch indicating the magnetization configurations in the stack within different field windows from states 1 to 7.

Image of FIG. 3.
FIG. 3.

(a) Magnetoresistance as a function of applied voltage. For each voltage the TMR is calculated as the resistance variation between the saturation (state 1) and the AF plateau (state 3) previously defined in Fig. 2. In positive bias, the positive voltage is applied at the bottom Fe-I electrode. (b) Output voltage vs applied voltage.

Loading

Article metrics loading...

/content/aip/journal/jap/99/8/10.1063/1.2166592
2006-04-19
2014-04-17
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Engineering of spin filtering in double epitaxial tunnel junctions
http://aip.metastore.ingenta.com/content/aip/journal/jap/99/8/10.1063/1.2166592
10.1063/1.2166592
SEARCH_EXPAND_ITEM