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Analysis of diffusive interface resistance for measurements with perpendicular current in multilayers
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10.1063/1.2176871
/content/aip/journal/jap/99/8/10.1063/1.2176871
http://aip.metastore.ingenta.com/content/aip/journal/jap/99/8/10.1063/1.2176871

Figures

Image of FIG. 1.
FIG. 1.

High-angle x-ray diffraction of multilayer. Satellite peaks around Nb(110) are indicated by arrows.

Image of FIG. 2.
FIG. 2.

Specific resistance vs bilayer number of two sets of samples with Nb thicknesses fixed at 15 and , respectively. The dashed lines are linear least squares fits to individual sets. The solid lines are global fit for two parameters and dash dot lines are global fit for four parameters to two sets of data simultaneously.

Image of FIG. 3.
FIG. 3.

(a) Specific resistance vs Fe thickness with Nb thickness fixed at and . (b) Specific resistance vs Nb thickness with Fe thickness fixed at and . The dashed lines are linear least squares fits to individual sets. The solid lines are global fit for four parameters to the data simultaneously.

Tables

Generic image for table
Table I.

The best derived values and parameters for the multilayers.

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/content/aip/journal/jap/99/8/10.1063/1.2176871
2006-04-26
2014-04-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Analysis of diffusive interface resistance for measurements with perpendicular current in Fe∕Nb multilayers
http://aip.metastore.ingenta.com/content/aip/journal/jap/99/8/10.1063/1.2176871
10.1063/1.2176871
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