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Room temperature air oxidation of nanostructured Si thin films with varying porosities as studied by x-ray photoelectron spectroscopy
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10.1063/1.2193168
/content/aip/journal/jap/99/8/10.1063/1.2193168
http://aip.metastore.ingenta.com/content/aip/journal/jap/99/8/10.1063/1.2193168
/content/aip/journal/jap/99/8/10.1063/1.2193168
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/content/aip/journal/jap/99/8/10.1063/1.2193168
2006-05-03
2014-09-03
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Room temperature air oxidation of nanostructured Si thin films with varying porosities as studied by x-ray photoelectron spectroscopy
http://aip.metastore.ingenta.com/content/aip/journal/jap/99/8/10.1063/1.2193168
10.1063/1.2193168
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