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Formation of an anisotropy lattice in multilayers by direct laser interference patterning
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10.1063/1.2191747
/content/aip/journal/jap/99/9/10.1063/1.2191747
http://aip.metastore.ingenta.com/content/aip/journal/jap/99/9/10.1063/1.2191747
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Direct laser interference patterning apparatus. , pulses from a Nd:YAG laser are split into two-to-four equal-intensity beams which interfere at the samples. The harmonic separator (HS) selects wavelength, the lens L permits adjustment of the light intensity at the sample surface, three 50% beam splitters (BS) create the four beams, which are directed to the sample surface by mirrors (M), and half-wave plates (HP) can be inserted to convert -polarized light to -polarized light.

Image of FIG. 2.
FIG. 2.

Two-beam interference. (a) Light intensity as a function of position, (b) optical microscopy image of a Co–C film after partial ablation by one pulse of the laser, and (c) optical microscopy image of a Co–C film which was subjected to one pulse from the laser, then rotated through a 90° angle, and subjected to a second pulse.

Image of FIG. 3.
FIG. 3.

Direct laser interference patterning geometry. Plane waves 1 and 2 propagate in the plane at angles of incidence and , while plane waves 3 and 4 propagate in the plane with angles of incidence and .

Image of FIG. 4.
FIG. 4.

Simulated four-beam interference patterns when all beams have polarization and all angles of incidence are (a) 35° and (b) 60°. All beams have polarization and all angles of incidence are (c) 35° and (d) 60°. Simulated four-beam interference patterns. Interference patterns when the angles of incidence for -directed beams are 30°, while for the -directed beams are 60°, (e) all beams have polarization, (f) all beams have polarization, and (g) the two -directed beams have polarization and the two -directed beams have polarization. For (h) all beams have polarization and the angles of incidence for -directed beams are 60°, while for the -directed beams they are 50° and 15°.

Image of FIG. 5.
FIG. 5.

(a) Optical microscopy image of partially ablated Co–C film showing secondary modulation pattern for an estimated 5° misalignment of beams. (b) Simulated image for 3° misalignment of beams.

Image of FIG. 6.
FIG. 6.

Simulated three-beam interference patterns for all three beams at 60° angle of incidence. (a) All polarizations, (b) -directed beams are polarization and -directed beams are polarization, (c) all beams are polarization with the -directed beams at 30° angle of incidence and -directed beams at 60° angles of incidence, and (d) -directed beam at 60° angle of incidence with polarization, and -directed beams at 30° angles of incidence and polarization.

Image of FIG. 7.
FIG. 7.

Low-angle x-ray diffraction for : (a) as-deposited and (b) patterned.

Image of FIG. 8.
FIG. 8.

(a) polar Kerr hysteresis loop for as-deposited film, (b) polar Kerr hysteresis loop for patterned film, (c) longitudinal Kerr hysteresis loop for as-deposited film, and (d) longitudinal Kerr hysteresis loop for patterned film.

Image of FIG. 9.
FIG. 9.

(a) MFM and (b) AFM images of film. The film has a overcoat. For this interference geometry, the dots are approximately ellipses of major axis of and minor axis of .

Image of FIG. 10.
FIG. 10.

MFM images of film in various applied reversing fields, as labeled (in Oe). The image in the upper left corner was taken in remanent state after saturation in a perpendicular field. Each image is .

Image of FIG. 11.
FIG. 11.

MFM images of film in various applied reversing fields, as labeled (in Oe). The image in the upper left corner was taken in the remanent state after saturation in an in-plane field. Each image is .

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/content/aip/journal/jap/99/9/10.1063/1.2191747
2006-05-11
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Formation of an anisotropy lattice in Co∕Pt multilayers by direct laser interference patterning
http://aip.metastore.ingenta.com/content/aip/journal/jap/99/9/10.1063/1.2191747
10.1063/1.2191747
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