1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Effect of annealing on the mobility and morphology of thermally activated pentacene thin film transistors
Rent:
Rent this article for
USD
10.1063/1.2193055
/content/aip/journal/jap/99/9/10.1063/1.2193055
http://aip.metastore.ingenta.com/content/aip/journal/jap/99/9/10.1063/1.2193055

Figures

Image of FIG. 1.
FIG. 1.

Schematic of the BC pentacene thin film transistor structure.

Image of FIG. 2.
FIG. 2.

Output characteristic of a pentacene TFT annealed at (solid lines). The output curves in the same voltage range before annealing (dot lines) are also listed for comparison.

Image of FIG. 3.
FIG. 3.

Output characteristic of a pentacene TFT annealed at (solid lines). The output curves in the same voltage range before annealing (dot lines) are also listed for comparison.

Image of FIG. 4.
FIG. 4.

Variation of mobility with time for the sample heated up to . The mobility values are derived at a moderate voltage of .

Image of FIG. 5.
FIG. 5.

Variation of mobility with time for the sample heated up to . The mobility values are derived at a moderate voltage of .

Image of FIG. 6.
FIG. 6.

Arrhenius plot of the logarithm mobility vs the reciprocal temperature.

Image of FIG. 7.
FIG. 7.

AFM images showing the morphology of (a) a RT reference sample without annealing, (b) the annealed sample, (c) annealed sample, (d) magnified image of the annealed sample, (e) magnified image of the RT sample, (f) magnified image of the annealed sample, and (g) magnified image of the annealed sample, where the white arrow indicates a cavity showing the bare substrate. The corresponding height profiles of the black lines indicated in (e)–(g) are also illustrated.

Image of FIG. 8.
FIG. 8.

Variation of mobility values at with time for the sample heated up to .

Image of FIG. 9.
FIG. 9.

Comparison of XRD patterns of pantacene films. (a) XRD patterns of the annealed sample and of a simultaneously deposited sample without annealing; (b) XRD patterns of the annealed sample and of a simultaneously deposited sample without annealing. The insets are the magnified peaks of the (001) plane showing the exact peak positions.

Image of FIG. 10.
FIG. 10.

Variation of mobility values at with time for a top contact (TC) FET heated up to .

Tables

Generic image for table
Table I.

Comparison of morphology data of the pentacene films.

Loading

Article metrics loading...

/content/aip/journal/jap/99/9/10.1063/1.2193055
2006-05-12
2014-04-19
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Effect of annealing on the mobility and morphology of thermally activated pentacene thin film transistors
http://aip.metastore.ingenta.com/content/aip/journal/jap/99/9/10.1063/1.2193055
10.1063/1.2193055
SEARCH_EXPAND_ITEM