Flow chart of PZT precursor preparation process.
TGA (a) and DTA (b) analysis of the PZT precursor at a heating rate of in air.
Schematic structures of multilayer PZT/PT thin films.
XRD patterns of the multilayer PZT/PT thin films.
The cross-section TEM image of the multilayer 5PZT/4PT thin film (a) dark field image, (b) bright field image of the same area with (a), and (c) enlarge bright field image.
HRTEM images on PT-on-PZT interface regions of the multilayer thin film (a) and (b).
SIMS composition depth profile of 5PZT/4PT multilayer thin film.
Dielectric properties of the films as a function of PT volume fraction (, ).
Dielectric constants as a function of frequency (1 Hz–100 kHz).
Dielectric loss tangents as a function of frequency (1 Hz–100 kHz).
Schematic diagram of space charge accumulation at the interface region.
Hysteresis loops of (a) 5PZT/4PT multilayer thin film and (b) pure PZT.
Charged defects intersecting at domain wall.
Hysteresis loops before and after ac-field cycling.
Corresponding pyroelectric currents with a temperature (a) increasing rate and (b) decreasing rate of .
Stacking structures of the multilayer thin films. (total thickness of PT layers in the film) and (total thickness of PZT layers in the film).
Properties comparison of multilayer 5PZT/4PT and pure PZT films.
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