Volume 119, Issue 20, 22 November 2003
Index of content:
119(2003); http://dx.doi.org/10.1063/1.1627328View Description Hide Description
The chemical and electronic structure of the interface between liquid water and a thin filmsurface was studied with synchrotron-based, high energy-resolution soft x-ray emission spectroscopy (XES). By probing the local environment around the sulfur atoms, an x-ray-induced sulfate formation at the surface can be monitored, correlated with a substantial enhancement of sodium impurity atoms from the film and its glass substrate. The results demonstrate that, with XES, an experimental probe is available to in situ study chemical reactions at liquid–solidinterfaces or at surfaces in a high-pressure gas environment in a chemically sensitive and atom-specific way.
119(2003); http://dx.doi.org/10.1063/1.1625370View Description Hide Description
and complexes are studied with mass-selected infrared photodissociationspectroscopy in the O–H (O–D) stretch region. Two vibrational bands are measured to the red from the symmetric and asymmetric stretches in free water. Rotational analysis for indicates a geometry with argon opposite water and significant expansion of the H–O–H angle. The level in the asymmetric stretch undergoes distortion consistent with selective excitation into the coordinate of an insertion reaction.