Experimental setup of USEXAS.
Data processing flow chart.
Results of x-ray diffraction patterns obtained with Si(111) and GaAs(111) crystals. Theoretical simulation is also shown.
USEXAS measurements of NiO (a), Ni (b), (aq) (c), and (aq) (d). Synchrotron data are also shown. FEFF calculations are given.
USEXAS measurements of NiTPP and NiTBTPP. FEFF simulations of NiTPP and NiTBHPP (without OH groups) are shown. Synchrotron data on NiTPP by Chen et al. are shown.
Structures of Ni and Zn complexes measured in this work. Only those directly bound to the metal are shown. Other atoms were used in the calculations but not shown here.
Spectral widths, yields, and diffraction data by Si and GaAs crystals of characteristic x-ray radiation from the W source.
Absorption edges of the Ni and Zn compounds measured with USEXAS. References are listed.
Article metrics loading...
Full text loading...