Schematic representation of the experimental setup used for the partial-ion-yield measurements.
Partial-ion yields for all detectable fragments in the vicinity of the S ionization thresholds. The positive fragments are shown on a scale reflecting the branching ratios measured with the TOF apparatus.
Least-squares fit of the unresolved , , , and resonances. Data points are the partial-ion yield of .
Partial-ion yield of in the vicinity of the , , and thresholds (vertical bars). The solid curve is a least-squares fit based on a semiclassical atomic PCI model, modified to take into account the three thresholds and vibrational components (see text for details).
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