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Imaging nanostructures with scanning photoionization microscopy
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10.1063/1.2354478
/content/aip/journal/jcp/125/15/10.1063/1.2354478
http://aip.metastore.ingenta.com/content/aip/journal/jcp/125/15/10.1063/1.2354478
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Schematic of experimental apparatus. D: laser pulse diagnostics, BBO: -barium borate frequency-doubling crystal, ND: neutral density filters, DIC: dichroic long-pass filter, EF: emission filter, P: confocal pinhole, TS: piezoelectrical translation stage, FC: Faraday cup, DAQ: data acquisition hardware and software, A: picoammeter.

Image of FIG. 2.
FIG. 2.

One-photon-excited confocal fluorescence microscopy image of dye-impregnated polystyrene beads using excitation power, excitation wavelength of , and fluorescence maximum at . Intensity profiles are shown for the marked bead.

Image of FIG. 3.
FIG. 3.

Power dependence of photoemission current for a thermally evaporated thick Ag film on glass cover slip. Excitation wavelength .

Image of FIG. 4.
FIG. 4.

(a) Photographic microscope image of a photolithographic thin Ag pattern thermally evaporated onto a cover slip. The holes (dark in the image) are on average large except for the two final rows left and right, which are in size. The solid silver (light in the image) serves as contact material to keep the sample at a well-defined potential. (b) Tapping-mode AFM image of area highlighted in (a), . (c) SPIM image of corner area highlighted in (a); pulse energy, , and bias potential. (d) Comparison of AFM (red) and SPIM (black) traces. The traces are taken at the arrow in (c).

Image of FIG. 5.
FIG. 5.

Photoelectron yield as a function of Faraday cup bias voltage for a electron gun evaporated Pt film. Fluence: .

Image of FIG. 6.
FIG. 6.

(a) SPIM image of a thick Au film deposited by thermal evaporation onto a glass cover slip with enhanced current at the film/glass edges. Center hole highlighted. (b) AFM close-up of highlighted hole on a scale. (c) (▴) SPIM trace taken at scale bar in (a). (—) Corresponding AFM trace from close-up in (b).

Image of FIG. 7.
FIG. 7.

Measured (circles) and model (solid line) two-photon photoemission yield as a function of film thickness for electron gun evaporated Au films on Pt supported on a glass cover slip.

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/content/aip/journal/jcp/125/15/10.1063/1.2354478
2006-10-19
2014-04-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Imaging nanostructures with scanning photoionization microscopy
http://aip.metastore.ingenta.com/content/aip/journal/jcp/125/15/10.1063/1.2354478
10.1063/1.2354478
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