AFM height [(a) and (b)] and phase images of films spin coated at onto the silicon wafers from DMF solution.
AFM height image of films spin coated at from DMF solution onto the carbon-coated mica. Plan-view TEM images of the transferred film on the copper grid from the carbon-coated mica: (b) without staining and (c) staining with .
AFM phase images of the films spin coated at onto the silicon wafers from DMF solutions of different concentrations: (a) , (b) , and (c) .
AFM height images of the films spin coated from DMF solution onto the silicon wafers at different spinning speeds: (a) and (b) .
XPS spectra with a series of tilting angles of the films spin coated from DMF solution at onto the silicon wafer (the sample of Fig. 1): (a) Si , (b) N , and (c) C .
Schematic representation of the formation of ordered microphase-separated nanostructure in thin films of by spin coating.
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