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Bonding-site dependence of surface resistivity: CO on epitaxial Cu(100) films
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Image of FIG. 1.
FIG. 1.

Resistance change of Cu(100) film during CO dosing at . During the CO exposure the resistance increases by an amount . The three curves correspond to three different CO exposures.

Image of FIG. 2.
FIG. 2.

Temperature-programed desorption from three coverages of CO on Cu(100) films exposed at . The three identifiable features are indicated with arrows.

Image of FIG. 3.
FIG. 3.

Analysis of TPD data (points) as the sum of three Gaussian functions plus a quadratic base line. The integrated area of each Gaussian is taken as a measure of the coverage of the corresponding CO species.

Image of FIG. 4.
FIG. 4.

Variation of the individual TPD peak intensities with the total integrated TPD intensity (i.e., CO coverage). The lines are linear fits.

Image of FIG. 5.
FIG. 5.

Comparison of three models for the dependence of the resistance change on TPD intensity. The line represents an ideal fit, and the shaded areas indicate the mean-square deviation between the data and the model. (a) Unrestricted linear fit, with independent coefficients , , and . (b) Fit to intensity of the terrace peak only: . The difference between this fit and the unrestricted fit is not statistically significant . (c) Fit to the total TPD intensity: . This fit is significantly worse than the other two .


Generic image for table
Table I.

Fitting parameters and statistical significance for linear regression analysis of the correlation between resistance change and the individual TPD peak intensities , , and , as described by Eq. (3). The first row represents a fit in which all three CO species are included. In the other lines one or more term constraints are applied to the model. Parentheses indicate constraints that are excluded by the data at a 99% confidence level.


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Bonding-site dependence of surface resistivity: CO on epitaxial Cu(100) films