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Influence of impurities on the x-ray photoelectron spectroscopy and Raman spectra of single-wall carbon nanotubes
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10.1063/1.2796153
/content/aip/journal/jcp/127/15/10.1063/1.2796153
http://aip.metastore.ingenta.com/content/aip/journal/jcp/127/15/10.1063/1.2796153

Figures

Image of FIG. 1.
FIG. 1.

(a) The TPO curve of the raw SWNT material obtained from the thermal pyrolysis of carbon monoxide over catalyst. (b) The TGA profile of the purified SWNT sample. The solid and dashed lines correspond to the weight change and the weight loss derivative , respectively.

Image of FIG. 2.
FIG. 2.

The SEM (a) and TEM (b) images of the purified SWNT sample obtained from CO disproportionation on catalyst.

Image of FIG. 3.
FIG. 3.

(a) The XPS full survey of the raw, oxidized, and purified SWNT samples. The inset expands the C excitation peaks. (b) X-ray photoemission spectra of single-wall carbon nanotubes at valence band.

Image of FIG. 4.
FIG. 4.

The Raman scattering profile of the purified SWNT sample demonstrated several features including the RMB, , , second, and bands.

Image of FIG. 5.
FIG. 5.

The RBM bands of the raw, oxidized, and purified SWNT materials excited at different laser energies.

Image of FIG. 6.
FIG. 6.

The and bands of the as-produced SWNT sample along with those of that after the preoxidization and purification treatments.

Tables

Generic image for table
Table I.

The atomic ratio concentration of the SWNT samples under different stages of purification process. The values in parentheses are the XPS sensitive factors for the corresponding elements. The accuracy of XPS in quantification is 5%–10%.

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/content/aip/journal/jcp/127/15/10.1063/1.2796153
2007-10-18
2014-04-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Influence of impurities on the x-ray photoelectron spectroscopy and Raman spectra of single-wall carbon nanotubes
http://aip.metastore.ingenta.com/content/aip/journal/jcp/127/15/10.1063/1.2796153
10.1063/1.2796153
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