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Dielectric fluctuations in force microscopy: Noncontact friction and frequency jitter
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View: Figures


Image of FIG. 1.
FIG. 1.

To probe electric field fluctuations, a charged cantilever tip oscillates in the direction at height above the surface of a dielectric sample of thickness .

Image of FIG. 2.
FIG. 2.

Measured power spectrum of cantilever frequency fluctuations without a sample. Both axes are logarithmic. The solid line is a fit to Eq. (6.7). At the lowest frequencies, the power spectrum is a constant determined by thermomechanical fluctuations [dash-dot line; Eq. (6.8)]. At higher frequency, the spectral density of cantilever frequency fluctuations increases quadratically due to detector noise [dashed line; Eqs. (6.7)–(6.9)].

Image of FIG. 3.
FIG. 3.

Predicted cantilever frequency jitter vs probe height. Note the logarithmic scale on both axes. The dashed line shows the calculated root-mean-squared frequency jitter from Eq. (6.3) for a cantilever having a tip radius of 30 nm held at 0.5 V over a 280 nm thick film of PMMA at room temperature. The solid line shows the minimum detectable frequency jitter calculated from Eq. (6.11) in a 100 Hz bandwidth, using known cantilever parameters and the measured height-dependent ringdown time.


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Dielectric fluctuations in force microscopy: Noncontact friction and frequency jitter