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The dewetting dynamics of the polymer thin film by solvent annealing
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10.1063/1.2918734
/content/aip/journal/jcp/129/4/10.1063/1.2918734
http://aip.metastore.ingenta.com/content/aip/journal/jcp/129/4/10.1063/1.2918734
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

A series of the OM images of the PS films with different film thicknesses on the Si wafer with the native oxide layer, which induced by acetone vapor at room temperature: (a) , (b) 65, (c) 90, (d) 110, (e) . The bar scale is .

Image of FIG. 2.
FIG. 2.

Dependence of hole radius on time for the PS films with different film thicknesses on the Si wafer with the native oxide layer, which is induced by acetone vapor at room temperature. The data of these film thicknesses (, 65, and ) were taken from our previous paper (Ref. 31).

Image of FIG. 3.
FIG. 3.

The plot of the average velocity of hole growth and the film thickness. The induced solvent is acetone.

Image of FIG. 4.
FIG. 4.

Dependence of the width of the rim on time for the PS films, which induced by acetone vapor at room temperature.

Image of FIG. 5.
FIG. 5.

A series of the OM images of the PS films with different molecular weights and different film thicknesses on the Si wafer with the native oxide layer, which induced by acetone vapor at room temperature: (a) , ; (b) , ; (c) , ; (d) , ; (e) , ; and (f) , . The bar scale is .

Image of FIG. 6.
FIG. 6.

Dependence of holes radius on time for the film with different molecular weights and different film thicknesses on the Si wafer with the native oxide layer, which induced by acetone vapor at room temperature: (a) , ; (b) , ; (c) , ; (d) , ; (e) , ; and (f) , .

Image of FIG. 7.
FIG. 7.

A series of the OM images of the PS films with different film thicknesses on the Si wafer with the native oxide layer, which induced by toluene vapor at room temperature: (a) and (b) . The bar scale is .

Image of FIG. 8.
FIG. 8.

Dependence of holes radius on time for the PS films, which induced by toluene vapor at room temperature.

Image of FIG. 9.
FIG. 9.

Dependence of the width of the rim on time for the PS films, which induced by toluene vapor at room temperature.

Image of FIG. 10.
FIG. 10.

The AFM profile images of the rims [PS film (, the film thickness )].

Image of FIG. 11.
FIG. 11.

A series of the OM images of the PS films with different film thicknesses on the Si wafer without the native oxide layer, which induced by acetone vapor at room temperature: (a) , (b) 67, and (c) . The bar scale is .

Image of FIG. 12.
FIG. 12.

Dependence of holes radius on time for the PS films with different film thicknesses on the Si wafer without the native oxide layer, which induced by acetone vapor at room temperature.

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/content/aip/journal/jcp/129/4/10.1063/1.2918734
2008-07-28
2014-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: The dewetting dynamics of the polymer thin film by solvent annealing
http://aip.metastore.ingenta.com/content/aip/journal/jcp/129/4/10.1063/1.2918734
10.1063/1.2918734
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