Structure of .
Scheme of the experimental apparatus for the x-ray reflectivity measurements.
(a) Plot of x-ray reflectivity vs momentum transfer with error bars of one standard deviation. The solid curve is the calculated Fresnel reflectivity for ideally flat and structureless surface [ and in Eq. (1)], and the dotted curve is the reflectivity for thermally fluctuated but structureless surface [ and is from Eq. (3)]. (b) vs plot. The solid curves are from the model fittings for the DC and LC models (red and blue, respectively) to the experimental plots (open circles).
Intrinsic electron density profiles at the surface of using parameters obtained from the fitting of the DC and LC models (red and blue, respectively) listed in Tables I and II. Gaussian profiles (black dotted lines) correspond to the electron density of ion layers in the DC model. The profile from the LC model is shifted by to ease the comparison of the two models.
Simplified schematics of the ionic multilayers at the surface. (a) Ionic layers without segregation of cations and anions between layers, (b) and (c) Ionic layers alternately composed of cations and anions. is the distance of the repetition depth of the layering structure to show a reflectivity peak at .
The ILs used for NR and XR measurements, the diameters of the cations and anions constituting the ILs, and critical temperatures of the ILs.
Parameters obtained by fitting the curve from the DC model to XR data.
Parameters obtained by fitting the curve from the LC model curve to XR data.
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