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Sulfur -edge photofragmentation of ethylene sulfide
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10.1063/1.3457946
/content/aip/journal/jcp/133/1/10.1063/1.3457946
http://aip.metastore.ingenta.com/content/aip/journal/jcp/133/1/10.1063/1.3457946

Figures

Image of FIG. 1.
FIG. 1.

Time-of-flight spectrum taken on top of the and resonance (2471.88 eV).

Image of FIG. 2.
FIG. 2.

Total-ion-yield spectrum, normalized to equal one on top of the first strong resonance (2471.88 eV) after removing the pre-edge signal. Dots denote locations for branching ratio values given in Tables II and III. The blue curves represent the peaks resulting from fitting of the TIY spectrum.

Image of FIG. 3.
FIG. 3.

Branching ratios following photoexcitation of near the S ionization threshold. The TIY, which was normalized to equal one on top of the first strong resonance (2471.88 eV) after removing the pre-edge signal, is added for comparison.

Image of FIG. 4.
FIG. 4.

Estimated branching ratios for the series, following photoexcitation of near the S ionization threshold. The TIY, which was normalized to equal one on top of the first strong resonance (2471.88 eV) after removing the pre-edge signal, is added for comparison.

Image of FIG. 5.
FIG. 5.

Comparison of branching ratios for , , and following photoexcitation of near the S ionization threshold. The TIY, which was normalized to equal one on top of the first strong resonance (2471.88 eV) after removing the pre-edge signal, is added for comparison.

Image of FIG. 6.
FIG. 6.

Comparison of branching ratios for and following photoexcitation of near the S ionization threshold. The TIY, which was normalized to equal one on top of the first strong resonance (2471.88 eV) after removing the pre-edge signal, is added for comparison.

Tables

Generic image for table
Table I.

Observed energies, , and term values, for excitation of S electrons in to and valence states and the Rydberg orbitals. All values are relative to the transition at 2486.0 eV (Ref. 19), which has an estimated 0.1 eV systematic error in photon energy reproducibility. “” denotes ionization energy as given in Ref. 15.

Generic image for table
Table II.

Observed branching ratios for fragment ions from at some selected photon energies near the S ionization threshold. Branching ratios of 10% or larger have estimated counting statistics of 1% to 3% and 5% systematic error. Branching ratios smaller than 10% have 10%–12% combined error except which has a 20% combined error.

Generic image for table
Table III.

Estimated branching ratios for , , , , and fragment ions, and their sum from photoexcitation of near the S ionization threshold. Estimated combined statistical error and systematic error of 15% for all except (estimated 10% combined error).

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/content/aip/journal/jcp/133/1/10.1063/1.3457946
2010-07-07
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Sulfur K-edge photofragmentation of ethylene sulfide
http://aip.metastore.ingenta.com/content/aip/journal/jcp/133/1/10.1063/1.3457946
10.1063/1.3457946
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