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A synchrotron-based photoemission study of the MoO3/Co interface
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View: Figures


Image of FIG. 1.
FIG. 1.

(a) The evolution of Mo 3d core level as a function of MoO3 thickness. (b), (c), (d), and (f) Fitting of the Mo 3d spectra at a nominal thickness of 0.4, 1.0, 4.0, and 9.0 nm. The green, blue, and red lines represent Mo4+, Mo5+, and Mo6+ component, respectively. Solid lines and the dotted lines demonstrate the results of least-squares fitting and experiment data, respectively.

Image of FIG. 2.
FIG. 2.

The evolution of Co 3p core level as a function of MoO3 thickness. All the spectra are normalized by the refocusing mirror current in front of the analyzing chamber, which is proportional to the photon flux. The inset in the left top corner shows the difference between the as-measured spectra at MoO3 thicknesses (0.4, 1.0, and 2.0 nm) and the spectrum of pristine Co film by subtracting the later from the prior spectra.

Image of FIG. 3.
FIG. 3.

(a), (b) The evolution of secondary electron cutoff and valence band as a function of MoO3 thickness. The inset in left top corner of (b) shows the peak fitting results of s1 and s2 after subtracting background from each spectrum. s1 and s2 are filled with horizontal and vertical bars, respectively. (c) A close-up of the near Fermi level region of the valence band.

Image of FIG. 4.
FIG. 4.

(a) The work function shift and the band bending of MoO3 as a function of MoO3 thickness; (b) the energy level diagram at MoO3/Co interface. The surface states s1 and s2 are below Fermi level with an overlap between them.


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: A synchrotron-based photoemission study of the MoO3/Co interface