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Low energy electron stimulated desorption from DNA films dosed with oxygen
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10.1063/1.4729781
/content/aip/journal/jcp/136/23/10.1063/1.4729781
http://aip.metastore.ingenta.com/content/aip/journal/jcp/136/23/10.1063/1.4729781
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Figures

Image of FIG. 1.
FIG. 1.

(a) Yield functions of 16O desorption from a self-assembled monolayer of DNA (SAM-DNA) and SAM-DNA dosed with an additional ∼0.75 ML (equivalent) of 16O2 at each indicated temperature. (b) Yield functions of OH desorption recorded under the same conditions as in (a). (c) Details of resonance structure seen in the O yield functions recorded at 165 K. The experimental data obtained by adding O2 (squares) can be reproduced (dashed line) by adding a scaled version of the data obtained at 55 K (dotted line) to the signal recorded for the pure SAM-DNA. The vertical arrow denotes the energy of the 2Πu state O2 .

Image of FIG. 2.
FIG. 2.

Time variation of energy-integrated (a) 18O and (b) 18OH desorption yields from a SAM-DNA sample as it is cooled to 50 K, dosed repeatedly with 18O2, and then heated to 250 K. The Y-axis represents the result of integrating anion yield functions over the range 2–18 eV.

Image of FIG. 3.
FIG. 3.

Anion yield functions for a) 18O and b) 18OH from SAM-DNA measured at 150 K after dosing with 3.5 ML of 18O2 at 50 K. Yield functions were obtained with an incident current of ∼2 nA, an energy step-size of 0.5 eV and 50,000 electrons pulses per point. The SAM-DNA films were irradiated with 0-18 eV electrons (at an incident current of 2 nA) for the indicated periods prior to their exposure to 18O2.

Image of FIG. 4.
FIG. 4.

Variation of the energy integrated yields of a) 18O and b) 18OH data of Fig. 3 with period of electron pre-irradiation (0 eV < E i< 18 eV) prior to exposure to 18O2.

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/content/aip/journal/jcp/136/23/10.1063/1.4729781
2012-06-20
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Low energy electron stimulated desorption from DNA films dosed with oxygen
http://aip.metastore.ingenta.com/content/aip/journal/jcp/136/23/10.1063/1.4729781
10.1063/1.4729781
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