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Plasmon-induced optical field enhancement studied by correlated scanning and photoemission electron microscopy
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10.1063/1.4799937
/content/aip/journal/jcp/138/15/10.1063/1.4799937
http://aip.metastore.ingenta.com/content/aip/journal/jcp/138/15/10.1063/1.4799937
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) Low magnification (5000×) multi-photon PEEM image of 34 nm average diameter silver nanoparticles on a silver thin film illuminated by p-polarized, 400 nm (∼3.1 eV) fs laser pulses at an incidence angle of 75°. Laser power is ∼10 mW. (b) High magnification (100 000×) multi-photon PEEM image of the silver nanoparticle appearing within the red square of Figure 1(a) . Identical illumination conditions as Figure 1(a) , except laser power is increased to ∼25 mW. The false color EF scale is calibrated where near 1 on the scale corresponds to the weak two-photon photoelectron emission of the silver thin film. (c) EF line profile of the silver nanoparticle appearing in Figure 1(b) . The experimental data (black circles) are fitted with a Gaussian line shape (solid green line). The laser propagation direction and electric field polarization are indicated in the figure by arrows (for p-polarization the electric vector is nearly parallel to the out-of-plane surface normal while the magnetic vector (B) lies within the plane of the page).

Image of FIG. 2.
FIG. 2.

FDTD simulations for a 30 nm diameter silver sphere on a flat silver surface. The perspective is taken from along the side of the nanoparticle parallel to the x-z plane. Panels (a-c) display the field magnitude at progressively increasing time steps for p-polarization, while panels (d-f) show increasing time steps for s-polarization. The light pulse propagation and electric field polarization are indicated in the figure with arrows.

Image of FIG. 3.
FIG. 3.

(a) High magnification (×105) multi-photon PEEM image of a 75 nm diameter silver nanoparticle supported on a silver thin film. Illumination conditions are identical to Figure 1(b) . (b) Same field-of-view as in Figure 3(a) , except for s-polarization. (c) Correlated SEM image of the silver nanoparticle appearing in Figures 3(a) and 3(b) . The relative orientation of the nanoparticle on the surface is the same as that appearing in Figures 3(a) and 3(b) . An outline of the nanoparticle shown in Figure 3(c) (solid white line) is overlaid in Figures 3(a) and 3(b) .

Image of FIG. 4.
FIG. 4.

FDTD simulations for a 75 nm diameter silver sphere on a flat silver surface. The perspective is taken from along the side of the nanoparticle parallel to the x-z plane. Panels (a-c) display the field magnitude at progressively increasing time steps for p-polarization, while panels (d-f) show increasing time steps for s-polarization. The light pulse propagation and electric field polarization are indicated in the Figure with arrows. For comparison, all images are scaled to an identical arbitrary range.

Image of FIG. 5.
FIG. 5.

(a) High magnification (×105) multi-photon PEEM image of a 114 nm diameter silver nanoparticle supported on a silver thin film surface. Illumination conditions are identical to that described in Figure 1(b) . (b) Same field-of-view as in Figure 5(a) , except for s-polarization. (c) Correlated SEM image of the silver nanoparticle appearing in Figures 5(a) and 5(b) . The relative orientation of the nanoparticle on the surface is the same as that appearing in Figures 5(a) and 5(b) . An outline of the nanoparticle shown in Figure 5(c) (solid white line) is overlaid in Figures 5(a) and 5(b) .

Image of FIG. 6.
FIG. 6.

Relative enhancement in photoelectron yield of silver nanoparticles plotted as a function of diameter of the nanoparticle. Green, red, and blue markers correspond to average diameters of 34, 75, and 122 nm, respectively.

Image of FIG. 7.
FIG. 7.

(a) High magnification (×105) multi-photon PEEM image of an irregularly shaped nanoparticle. Illumination conditions are identical to Figure 1(b) . The vertical and horizontal dashed lines are used in the EF profiles of Figures 9(a) and 9(b) (solid black lines), respectively. (b) Identical field-of-view as in Figure 7(a) , except for s-polarization. The vertical and horizontal dashed lines are used in the EF profiles of Figures 9(a) and 9(b) (dashed black lines), respectively. (c) Correlated SEM image of the nanoparticle appearing in Figures 7(a) and 7(b) . The relative orientation of the nanoparticle on the surface is the same as that appearing in Figures 7(a) and 7(b) . An outline of the nanoparticle shown in Figure 7(c) (solid white line) is overlaid in Figures 7(a) and 7(b) .

Image of FIG. 8.
FIG. 8.

(a) High magnification (×105) multi-photon PEEM image of a misshaped nanoparticle. Illumination conditions are identical to that described in Figure 1(b) . The vertical and horizontal dashed lines are used in the EF profiles of Figures 9(c) and 9(d) (solid black lines), respectively. (b) Same field-of-view as in Figure 8(a) , except for s-polarization. The vertical and horizontal dashed lines are used in the EF profiles in Figures 9(c) and 9(d) (dashed black lines), respectively. (c) Correlated SEM image of the nanoparticle appearing in Figures 8(a) and 8(b) . The relative orientation of the nanoparticle on the surface is the same as that appearing in Figures 8(a) and 8(b) . An outline of the nanoparticle from Figure 8(c) (solid white line) is overlaid in the images of Figures 8(a) and 8(b) .

Image of FIG. 9.
FIG. 9.

(a) EF line profiles corresponding to the vertical white dashed lines for the misshaped nanoparticle of Figures 7(a) and 7(b) . (b) EF line profiles corresponding to the horizontal white dashed lines for the misshaped nanoparticle of Figures 7(a) and 7(b) . (c) EF line profiles corresponding to the vertical white dashed lines for the elongated nanoparticle of Figures 8(a) and 8(b) . (d) EF line profiles corresponding to the horizontal white dashed lines for the elongated nanoparticle of Figures 8(a) and 8(b) . For all line profiles, the solid black line refers to p-polarization while the black dash line refers to s-polarization. The scaling factors for the p-polarization EF line profiles are indicated in the figure with an arrow.

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/content/aip/journal/jcp/138/15/10.1063/1.4799937
2013-04-15
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Plasmon-induced optical field enhancement studied by correlated scanning and photoemission electron microscopy
http://aip.metastore.ingenta.com/content/aip/journal/jcp/138/15/10.1063/1.4799937
10.1063/1.4799937
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