FE-SEM image of DLN film surface on silicon substrate shows ∼25 nm size clusters situated randomly and inset FE-SEM image represent the surface structure used for solar cell ARC experiment.
FTIR analysis of deposited ARNAB film on silicon substrate shows typical DLN structure.
HRTEM of ARNAB Film shows 3–5 nm nanocrystalline phase of c-Si3N4 and c-SiC.
Spectral reflectance of (a) textured c-Si, (b) textured with commercial PECVD SiNx layer, and (c) textured c-Si with ARNAB layer. The inset graph shows solar weighted average reflectance with different surface.
Transmission with reflection characteristics of glass substrate and ARNAB coating glass substrate. The inset graph for estimation of optical band gap of the film, and it was 3.54 eV.
PL intensity of ARNAB film with silicon substrate.
EQE of c-Si solar cell (A) textured c-Si (B) with ARNAB layer and (C) with commercial SiNx layer.
Photographs of ARNAB coated (a) textured c-Si and (b) textured c-Si solar cell.
Comparative solar cells performance parameters.
Article metrics loading...
Full text loading...