Schematic of a thin film CdTe solar cell in superstrate configuration.
Water contact angle images (a) prior and (b) post plasma treatment.
Three dimensional CCI images of CdS deposited on (a) untreated and (b) plasma treated substrates (20 sccm O2/30 sccm Ar).
Mean depth and width of pinholes in CdS observed on the surface of the untreated samples. The thickness of the CdS layer was 50 nm.
SEM images of CdS films grown on (a) untreated and (b) plasma treated (20% O2/30% Ar) FTO coated glass.
XPS measurements of samples untreated and plasma treated (20 sccm O2) for Cd 3d5/2 (a) and S2p peak (b).
n (a) and k (b) dispersions measured for CdS films deposited on the untreated substrate and the plasma treated substrate (20 sccm of O2).
Transmission and reflection spectra for CdS thin films deposited on TEC 15, comparing the untreated and the plasma treated surface, with 20 sccm of O2.
Energy band gap (Eg) of the untreated and plasma treated sample, estimated from the [αhν]2 = f(hν), by using the Urbach equation.
Atomic % composition as determined by XPS.
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