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Depairing critical currents and self-magnetic field effects in submicron microbridges and bicrystal junctions
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10.1063/1.1645178
/content/aip/journal/ltp/30/3/10.1063/1.1645178
http://aip.metastore.ingenta.com/content/aip/journal/ltp/30/3/10.1063/1.1645178
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/content/aip/journal/ltp/30/3/10.1063/1.1645178
2004-03-18
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Depairing critical currents and self-magnetic field effects in submicron YBa2Cu3O7−δ microbridges and bicrystal junctions
http://aip.metastore.ingenta.com/content/aip/journal/ltp/30/3/10.1063/1.1645178
10.1063/1.1645178
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