Nonmonotonous surface temperature dependence of the resistance in perfect HTS single crystal (thin film) at different frequencies , in schematic form; see, e.g., Refs. 4 and 17. When frequency increases the peak smears and its position shifts to higher temperatures.
dependence of a film on a sapphire substrate, measured by the coplanar resonator technique at (semi-log scale). The straight line corresponds to the exponential temperature dependence of : with the small gap value .23
The ac penetration depth measured by the coplanar resonator technique at different frequencies , 17.25, and .
for two OMS films, 35 and 10, at different frequencies. for Cu is shown for comparison.
dependence for the perfect film 35 at three different frequencies normalized by .
Manifestation of the observed two-peak peculiarity in the ac penetration depth dependencies.
Schematic representation of the order parameter anisotropy and quasiparticle scattering in the case of symmetry of Cooper pairing.
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