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Microwave response of single crystal films as a probe for pairing symmetry
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View: Figures


Image of FIG. 1.
FIG. 1.

Nonmonotonous surface temperature dependence of the resistance in perfect HTS single crystal (thin film) at different frequencies , in schematic form; see, e.g., Refs. 4 and 17. When frequency increases the peak smears and its position shifts to higher temperatures.

Image of FIG. 2.
FIG. 2.

dependence of a film on a sapphire substrate, measured by the coplanar resonator technique at (semi-log scale). The straight line corresponds to the exponential temperature dependence of : with the small gap value .23

Image of FIG. 3.
FIG. 3.

The ac penetration depth measured by the coplanar resonator technique at different frequencies , 17.25, and .

Image of FIG. 4.
FIG. 4.

for two OMS films, 35 and 10, at different frequencies. for Cu is shown for comparison.

Image of FIG. 5.
FIG. 5.

dependence for the perfect film 35 at three different frequencies normalized by .

Image of FIG. 6.
FIG. 6.

Manifestation of the observed two-peak peculiarity in the ac penetration depth dependencies.

Image of FIG. 7.
FIG. 7.

Schematic representation of the order parameter anisotropy and quasiparticle scattering in the case of symmetry of Cooper pairing.


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Microwave response of single crystal YBa2Cu3O7−δ films as a probe for pairing symmetry