Suppression of superconductivity in amorphous with increasing disorder (adapted from Graybeal and Beasley). The solid line is a theoretical fit as proposed by Finkel’stein.
Evolution of the temperature dependence of the sheet resistance R(T) with thickness for an a-Bi film deposited onto a-Ge. Fewer than half of the traces actually acquired are shown. The film thicknesses shown here range from from top to bottom.
Resistance per square as a function of the scaling variable for seventeen different temperatures, ranging from . Different symbols represent different temperatures. The inset shows the temperature dependence of t.
Normalized resistance per square as a function of the scaling variable . Each symbol represents one film at different temperatures. For clarity, only a small portion of the data is shown. Inset: the fitting parameter t determines the value of .
Phase diagram in the plane in the limit . The points on the phase boundary were obtained from disorder-driven transitions (triangles) and magnetic-field-driven transitions (circles). Values of the critical exponent products are shown next to arrows giving the direction in which the boundary was crossed. Here is the zero-eld critical thickness.
The critical resistance as a function of the critical field for a series of bismuth films. Here decreases with increasing thickness, as thicker films have lower normal-state resistances and higher critical fields.
Finite size (temperature) scaling plot for a thick film with and B as the tuning parameter. The data shown here range from . The best collapse of the data to a universal law was achieved with . Inset: isotherms of R(B) at temperatures between 150 and .
Resistance vs. temperature, R(T), at various values of for a thick film with . Data are shown from . The values of that are shown, from top to bottom, are 0, 0.62, 1.13, 1.43, 1.61, 1.83, 2.04, 2.37, 2.63, and . For clarity, forty four curves of R(T) for other values of are omitted from the plot. Inset: slope of ln (T) vs. .
Finite size scaling plot for a thick film with , including data from with as the tuning parameter. Fifty four values of between 0 and have been included. The best collapse of the data was for with an uncertainty of . Inset: for isotherms between 60 and . If the ln T dependence of the normal state resistance is taken out of the superconducting films, the scaling can be extended up to .
Resistance at as a function of resistance at for electrostatic (circles) and thickness (squares) tuned SI transitions. As superconductivity develops, the resistance at changes much more for thickness tuning than for electrostatic tuning.
(a) Differential resistance vs. measurement current for a parallel magnetic field tuned transition. From bottom to top the magnetic fields are 2, 3, 4, 5, 6, 6.5, 7, 7.5, 8, 9, 10, 1, and . (b) Electric field scaling for the data of (a).
Article metrics loading...
Full text loading...