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Global particle-in-cell simulations of fast-particle effects on shear Alfvén waves
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10.1063/1.3207878
/content/aip/journal/pop/16/8/10.1063/1.3207878
http://aip.metastore.ingenta.com/content/aip/journal/pop/16/8/10.1063/1.3207878
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

The shear Alfvén spectrum for the case considered (for parameters see main text). The SAW continuum is plotted. The dominant frequency resulting from the PIC simulation (the stable TAE mode) is compared with the TAE mode computed with the ideal MHD eigenvalue code.

Image of FIG. 2.
FIG. 2.

Time dependency of the electrostatic (left) and magnetic (right) potentials measured with the PIC code. One sees that the poloidal modes are coupled with each other.

Image of FIG. 3.
FIG. 3.

Radial structures of the electrostatic (left) and magnetic (right) potentials measured with the PIC code. One sees that the mode is centered on the gap position and has a TAE-type poloidal spectrum.

Image of FIG. 4.
FIG. 4.

The frequency (left) and the growth rate (right) of the TAE mode destabilized by the fast particles (sweep over the fast particle density, the fast particle temperature is kept constant). The TAE mode transforms continuously into the EPM instability as increases. On the right, the PIC growth rate (solid line) is compared with the growth rates resulting from the hybrid-MHD approach (Refs. 34 and 35) (dashed line). For parameters see the main text.

Image of FIG. 5.
FIG. 5.

Radial structures of the electrostatic (left) and magnetic (right) potentials measured with the PIC code for the EPM mode corresponding to (this mode can be dubbed a TAE-type EPM similar to Ref. 19). This EPM mode has a poloidal spectrum similar to the TAE mode but the radial width is much larger than that of a typical TAE mode such as shown in Fig. 3.

Image of FIG. 6.
FIG. 6.

The frequency (left) and the growth rate (right) of the TAE mode destabilized by the fast particles (sweep over the temperature of the fast particles, is kept constant). On the right, the PIC growth rate, which includes all FLR and FOW effects (solid line, circles), is compared with the PIC growth rate resulting from the simulations without the fast-particle FLR effects (dotted line, squares). The hybrid-MHD (Refs. 34 and 35) growth rate (dashed line, no symbols) is shown, too. For other parameters see main text.

Image of FIG. 7.
FIG. 7.

The frequency (left) and the growth rate (right) of the TAE mode destabilized by the fast particles (sweep over the temperature of the fast particles, is kept constant). EPM instability appears at the lower temperatures, where the fast particles resonantly interact with the bottom part of the continuum. For parameters see main text.

Image of FIG. 8.
FIG. 8.

Radial structures of the electrostatic (left) and magnetic (right) potentials measured with the PIC code (for , see Fig. 7). The mode is centered in the position of the gap and has a TAE-type poloidal spectrum (with the dominant poloidal modes and ).

Image of FIG. 9.
FIG. 9.

Radial structures of the electrostatic (left) and magnetic (right) potentials measured with the PIC code (for , see Fig. 7). The mode is shifted radially from the gap position. A single poloidal mode dominates. This is a nonperturbative EPM mode.

Image of FIG. 10.
FIG. 10.

The frequency (left) and the growth rate (right) of the TAE mode (sweep over the fast-particle density gradient). The fast-particle temperature , the fast particle density . For other parameters see main text.

Image of FIG. 11.
FIG. 11.

The radial structure of the electrostatic potential obtained with the PIC code. The figure on the left corresponds to . The figure on the right results from the simulations with . Other parameters in these two simulations coincide.

Image of FIG. 12.
FIG. 12.

The frequency (left) and the growth rate (right) of the TAE mode destabilized by the fast particles (convergence study with respect to the marker resolution). The fast-particle temperature , the fast particle density . For other parameters see main text.

Image of FIG. 13.
FIG. 13.

The frequency (left) and the growth rate (right) of the TAE mode destabilized by the fast particles (convergence study with respect to the radial grid resolution). The fast-particle temperature , the fast particle density . For other parameters see main text.

Image of FIG. 14.
FIG. 14.

The frequency (left) and the growth rate (right) of the TAE mode destabilized by the fast particles (convergence study with respect to the number of iterations in Ampére’s law). In this simulation, ion markers, electron markers, and fast-particle markers have been taken. The radial resolution is . The fast-particle temperature , the fast particle density .

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/content/aip/journal/pop/16/8/10.1063/1.3207878
2009-08-21
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Global particle-in-cell simulations of fast-particle effects on shear Alfvén waves
http://aip.metastore.ingenta.com/content/aip/journal/pop/16/8/10.1063/1.3207878
10.1063/1.3207878
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