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Radial profiles of (a) electron temperature and (b) , (c) density, and (d) , (e) ion temperature and (f) for the cases with ECH and NBI heating (red dashed) and NBI heating only (black solid) are plotted vs , the normalized square root of the toroidal flux. Derivatives are calculated with respect to non-normalized square root of toroidal flux. The dotted lines indicate the standard deviation calculated from an ensemble of 100 profile fits. ECH power is deposited at in the case with ECH (red). Electron temperature and density fluctuations are measured at , 0.6, and 0.7 (shading).
(a) and (b) in cases with no ECH (black solid) and with ECH (red dashed). The mean diffusivity and standard deviation (dotted lines) are calculated from an ensemble of 100 ONETWO analyses using as input 100 sets of spline fits to measured radial profiles. Electron temperature and density fluctuations are measured between (yellow shading).
Spectra of (a) density fluctuations and (b) electron temperature fluctuations measured at in the L-mode with ECH and NBI heating (red dashed) and with NBI heating only (black solid). Fluctuation levels (40–400 kHz) are recorded in the figure. Electron temperature fluctuation amplitude increases 50% in the case with ECH; density fluctuation amplitude does not change.
The profile of the relative amplitudes of (a) density fluctuations and (b) electron temperature fluctuations with ECH and NBI heating (red circles) and with NBI heating only (black squares). The green shaded region in (b) indicates the noise limit for measurements.
The change in [(a), (c), and (e)] TEM and [(b), (d), and (f)] ITG mode growth rates at three radii of interest is shown. The horizontal dashed line indicates the two-shot average (with and without ECH) of the flux-surface averaged shearing rate. The estimated wavenumber sensitivity range for the fluctuation diagnostics is indicated with shading.
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