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A Method of Correcting for Incident Ion Buildup Effects in Measurements of Thick Target X‐Ray Yields from Ion‐Atom Collisions
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10.1063/1.1685285
/content/aip/journal/rsi/42/7/10.1063/1.1685285
http://aip.metastore.ingenta.com/content/aip/journal/rsi/42/7/10.1063/1.1685285
/content/aip/journal/rsi/42/7/10.1063/1.1685285
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/content/aip/journal/rsi/42/7/10.1063/1.1685285
2003-11-04
2014-09-30
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: A Method of Correcting for Incident Ion Buildup Effects in Measurements of Thick Target X‐Ray Yields from Ion‐Atom Collisions
http://aip.metastore.ingenta.com/content/aip/journal/rsi/42/7/10.1063/1.1685285
10.1063/1.1685285
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