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Interference method for monitoring the refractive index and the thickness of transparent films during deposition
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10.1063/1.1141212
/content/aip/journal/rsi/61/4/10.1063/1.1141212
http://aip.metastore.ingenta.com/content/aip/journal/rsi/61/4/10.1063/1.1141212
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/content/aip/journal/rsi/61/4/10.1063/1.1141212
1990-04-01
2014-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Interference method for monitoring the refractive index and the thickness of transparent films during deposition
http://aip.metastore.ingenta.com/content/aip/journal/rsi/61/4/10.1063/1.1141212
10.1063/1.1141212
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