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Waveform analysis with optical multichannel detectors: Applications for rapid‐scan spectroscopic ellipsometry
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10.1063/1.1142390
/content/aip/journal/rsi/62/8/10.1063/1.1142390
http://aip.metastore.ingenta.com/content/aip/journal/rsi/62/8/10.1063/1.1142390
/content/aip/journal/rsi/62/8/10.1063/1.1142390
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/content/aip/journal/rsi/62/8/10.1063/1.1142390
1991-08-01
2014-09-01
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Waveform analysis with optical multichannel detectors: Applications for rapid‐scan spectroscopic ellipsometry
http://aip.metastore.ingenta.com/content/aip/journal/rsi/62/8/10.1063/1.1142390
10.1063/1.1142390
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