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Low‐energy‐electron‐diffraction system using a high‐performance electron gun and position‐sensitive detectors
1.J. B. Pendry, Low Energy Electron Diffraction (Academic, New York, 1974).
2.M. A. Van Hove and S. Y. Tong, Surface Crystallography by LEED (Springer, Berlin, 1979).
3.M. A. Van Hove, W. H. Weinberg, and C.-M. Chan, Low-Energy Electron Diffraction (Springer, Berlin, 1986).
4.M. Henzler, in Electron Spectroscopy for Surface Analysis, edited by H. Ibach (Springer, Berlin, 1977).
5.M. G. Lagally and J. A. Martin, Rev. Sci. Instrum. 54, 1273 (1983).
6.D. W. Kruger, D. E. Savage, and M. G. Lagally, Phys. Rev. Lett. 63, 402 (1989).
7.J. B. Pendry, in The Structure of Surfaces, edited by M. A. Van Hove and S. Y. Tong (Springer, Berlin, 1985).
8.Leybold Inc., SPA LEED, Export, PA.
9.Omicron Associates, Spot Profile Analysis LEED, Pittsburgh, PA.
10.M. D. Chinn and S. C. Fain, J. Vac. Sci. Technol. 14314 (1977).
11.P. C. Stair, Rev. Sci. Instrum. 51, 132 (1980).
12.E. G. McRae, R. A. Malic, and D. A. Kapilow, Rev. Sci. Instrum. 56, 2077 (1985).
13.Two resistive anode detectors and position-sensing electronics are supplied by Quantar Technology Inc., Santa Cruz, CA.
14.Y. Cao and E. H. Conrad, Rev. Sci. Instrum. 60, 2642 (1989).
15.B. L. Clothier, M. A. Thesis, University of Texas, 1991.
16.Kimball Physics Inc., model ES-423B, Wilton, NH.
17.Perkin-Elmer Inc., Eden Prairie, MN.
18.A software package SIMION is used for the simulations. SIMION is written by D. A. Dahl and J. E. Delmore at the Idaho National Engineering Laboratory, Idaho.
19.Buckbee-Mears Operation, St. Paul, MN.
20.R. L. Park, J. E. Houston, and D. G. Schreiner, Rev. Sci. Instrum. 42, 60 (1971).
21.For a more detailed discussion about transfer width, please see G. Comsa, Surf. Sci. 81, 57 (1979).
22.To resolve the problem associated with the Moire effect, we can either use hemispherical grids with higher mesh density or remove the entire grid system. The retarding fields can be supplied by biasing the first MCP when the grid system is removed. Our current grid system has a mesh density of 100 lines per inch with 83% transmission.
23.G. S. Glander and M. B. Webb, Surf. Sci. 224, 60 (1989).
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