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Noise reduction in atomic force microscopy: Resonance contact mode
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10.1063/1.1146602
/content/aip/journal/rsi/67/2/10.1063/1.1146602
http://aip.metastore.ingenta.com/content/aip/journal/rsi/67/2/10.1063/1.1146602
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/content/aip/journal/rsi/67/2/10.1063/1.1146602
1996-02-01
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Noise reduction in atomic force microscopy: Resonance contact mode
http://aip.metastore.ingenta.com/content/aip/journal/rsi/67/2/10.1063/1.1146602
10.1063/1.1146602
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