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A low temperature focused ion beam system: Application to in situ processing of high T c superconducting devices
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10.1063/1.1146625
/content/aip/journal/rsi/67/2/10.1063/1.1146625
http://aip.metastore.ingenta.com/content/aip/journal/rsi/67/2/10.1063/1.1146625
/content/aip/journal/rsi/67/2/10.1063/1.1146625
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/content/aip/journal/rsi/67/2/10.1063/1.1146625
1996-02-01
2014-10-31
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: A low temperature focused ion beam system: Application to insitu processing of high Tc superconducting devices
http://aip.metastore.ingenta.com/content/aip/journal/rsi/67/2/10.1063/1.1146625
10.1063/1.1146625
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