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Atomic force microscope detector drift compensation by correlation of similar traces acquired at different setpoints
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10.1063/1.1475352
/content/aip/journal/rsi/73/6/10.1063/1.1475352
http://aip.metastore.ingenta.com/content/aip/journal/rsi/73/6/10.1063/1.1475352
/content/aip/journal/rsi/73/6/10.1063/1.1475352
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/content/aip/journal/rsi/73/6/10.1063/1.1475352
2002-05-21
2014-09-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Atomic force microscope detector drift compensation by correlation of similar traces acquired at different setpoints
http://aip.metastore.ingenta.com/content/aip/journal/rsi/73/6/10.1063/1.1475352
10.1063/1.1475352
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