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Simultaneous atomic force microscopy measurement of topography and contact resistance of metal films and carbon nanotubes
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10.1063/1.1590750
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    Affiliations:
    1 Department of Chemistry, University of North Carolina at Chapel Hill, Chapel Hill, North Carolina 27599
    2 Department of Physics and Astronomy, University of North Carolina at Chapel Hill, Chapel Hill, North Carolina 27599
    3 Curriculum in Applied and Materials Science, University of North Carolina at Chapel Hill, Chapel Hill, North Carolina 27599
    4 Department of Physics and Astronomy, Department of Computer Science, and Curriculum in Applied and Materials Science, University of North Carolina at Chapel Hill, Chapel Hill, North Carolina 27599
    Rev. Sci. Instrum. 74, 3653 (2003); http://dx.doi.org/10.1063/1.1590750
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/content/aip/journal/rsi/74/8/10.1063/1.1590750
2003-07-23
2014-08-30
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Simultaneous atomic force microscopy measurement of topography and contact resistance of metal films and carbon nanotubes
http://aip.metastore.ingenta.com/content/aip/journal/rsi/74/8/10.1063/1.1590750
10.1063/1.1590750
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