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Comparison of nanometer-thick films by x-ray reflectivity and spectroscopic ellipsometry
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10.1063/1.1848660
/content/aip/journal/rsi/76/2/10.1063/1.1848660
http://aip.metastore.ingenta.com/content/aip/journal/rsi/76/2/10.1063/1.1848660
/content/aip/journal/rsi/76/2/10.1063/1.1848660
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/content/aip/journal/rsi/76/2/10.1063/1.1848660
2005-01-10
2014-10-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Comparison of nanometer-thick films by x-ray reflectivity and spectroscopic ellipsometry
http://aip.metastore.ingenta.com/content/aip/journal/rsi/76/2/10.1063/1.1848660
10.1063/1.1848660
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