Layout of the monolithic array of 19 SDDs. The detector side where the drift rings and the front-end JFET are integrated is shown. The scintillator is coupled to the opposite side of the detector.
(a) Cross section (not to scale) of the SDD showing the back side biasing technique based on the a reach-through flow of the leakage hole current toward the last ring electrode. (b) Drawing of the potential distribution in the described biasing conditions. Zero length and depth are located at the center of the anode.
Schematic cross section of the assembly structure of the Anger camera.
Scheme of the collimation system adopted in the measurements.
Calculated intensity distribution of the -ray source through the collimator.
Electronics noise of the array units measured at . Unit 8 is not reported because it is damaged.
2D position distribution of four irradiation points in the central region of the array.
Fitting of the distribution shown in Fig. 6 across two points.
(a) 2D distribution of 11 points disposed along a line. (b) Scheme illustrating the distances among the points.
(a) Measured coordinates of the points along the scan. (b) Deviation from the fitting line.
Measured resolution of the irradiated points. The intrinsic resolution of the Anger camera obtained by subtracting in square the contribution of the collimator is also reported.
Energy spectrum of the source measured on a central point of the scan.
Energy resolution of the points measured in the scan.
Event total measured signal obtained by summing all signals from the units.
2D distribution of three points obtained by irradiation with a source.
Photograph of the collimator used for the test of the imaging capabilities of the Anger camera.
Irradiation scheme of the Anger camera using the lead collimator.
Images measured with the Anger camera in correspondence of two orientations of the collimator.
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